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(1) Plasmos Ellipsometer Model SD2002, Laser System Function: Optical transparent thin film measurement system Purpose: Discrete wavelengths of 632.8nm and 1550nm information limit, several micron (optically transparent) measuring spot diameter, 50 micron; Facilities: Automatic measurement of refractive index and thickness of a thin layer. Possibility for mapping of a substrate. Model evaluation of thickness and refractive index for multi-layer system: maximum number of layers is five. Typical Application: Determination of optical properties of thin films, dielectrics, semiconductors, metals, high-TC superconductors, silicium oxide and silicium nitride layer characterization; Wafer Specifications: Clean wafers only, virtually every substrate material; 1. Video Monitor Model 0M200A; 2. Leica Model KL1500 Electronic Lense Objectives; 3. Electrophysics Model AF-850 Microscope Autofocus System; 4. AF-850 X and Y window position; 5. Control switches for auto focus, next focus, forward, reverse, enter and select. California Sales Tax 8.25% is required for California residents, unless a resale certificate is presented. Manufacturer's Representive Specializing New/Refurbished Semiconductor Equipment. This item was purchased for resale and was NOT used by seller. This item can be previewed and inspected by appointment only at our location in Chatsworth, CA. If you have any questions, please call us at (***) 734-9043. Note: Merchandise will be held until funds clear. Pick-up location: Northern, CA (Located at our Northern, CA warehouse) Merchandise must be paid for within 3 days. EMAIL: loraine_hooper@modularparts.com (please look at our rules and privacy policy) |
loraine_hooper@modularparts.com (Loraine Hooper) for more information. This email will be sent to Loraine Hooper' actual email address.
