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6 Inch Wafer Manual Sanding Probe Station This Rucker & Kolls 660J 6 inch Manual Sanding Probe Station is in good cosmetic condition with some surface wear. It comes with the Bausch & Lomb StereoZoom 4 microscope. According to our research, the Model 660J Manual Sanding Station was designed for cleaning and planarizing of probe cards. The joystick driven stage with 6" chuck gives the operator maximum movement control. It comes as pictured. We have no experience using this system and welcome your questions. We have no means to fully test it. See our other listings for more semiconductor inspection equipment this week. Let's do the time-warp again ! (please look at our rules and privacy policy) |
N.Henderson@modularparts.com (Nicole Henderson) for more information. This email will be sent to Nicole Henderson' actual email address.
